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BBOI talk at 2016 PIC international conference

December 2015 
BBOI talk at 2016 PIC international conference
BBOI results on the CLIPP transparent detector will be presented at the 2016 PIC International Conference in Brussels on March 1-2, 2016. The talk entitled “Taking a close, damage-free look at the light in photonic integrated circuits” will be given by BBOI team member Stefano Grillanda.

PIC International provides comprehensive coverage of all aspects of this industry, from basic research to materials, equipment, packaging, and the incorporation of chips in data centres and optical networks. Attendees at the inaugural PIC International conference will hear industry-leading insiders delivering more than 30 presentations spanning six sectors.

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Details on speakers and abstracts can be found on 2016 PIC conference website.


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